Structural & Optical Characterization of Gex Se80-x Pb20 Thin Films Prepared by Thermal Evaporation Technique
نویسندگان
چکیده
Vacuum evaporated films of GexSe80-xPb20 have been characterized by using optical spectroscopy (especially transmission and absorption spectra). The chalcogenide glass of GexSe80-xPb20 has been prepared by melt quenching technique. Thin films of GexSe80-xPb20 are deposited by vacuum thermal evaporation technique on highly clean glass substrates and their optical properties such as refractive index (n), extinction coefficient (k), and energy band gap have been studied. The transmission spectra in the spectral range 300-2000 nm has been used to calculate the refractive index (n), extinction coefficient (k) of the films have been studied. Optical spectroscopy of the films has been done with the help of the Shimadzu U-3600 (UVVis-NIR) Spectrophotometer. The structural analysis is studied through X-ray diffraction.
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